{"created":"2025-06-05T06:28:23.912138+00:00","id":2000097,"links":{},"metadata":{"_buckets":{"deposit":"1baefbee-8d0d-4851-9ca5-74ba8cc73ede"},"_deposit":{"created_by":12,"id":"2000097","owner":"12","owners":[12],"pid":{"revision_id":0,"type":"depid","value":"2000097"},"status":"published"},"_oai":{"id":"oai:junshin.repo.nii.ac.jp:02000097","sets":["1:6:82:1746836280329"]},"author_link":[],"item_10002_biblio_info_7":{"attribute_name":"bibliographic_information","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2025-06-16"},"bibliographicIssueNumber":"15","bibliographicNumberOfPages":"8","bibliographicPageEnd":"94","bibliographicPageStart":"87"}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Although complex to handle, ionization chambers are standard instruments for radiation dosimetry. This study\ncompared two semiconductor dosimeters（the Dose Probe and Piranha 657）with an ionization chamber to evaluate the\naccuracy of air kerma measurements, including scattered radiation. The dose, energy, and object thickness dependence\nwere verified using PMMA. The relative dose and error were calculated using an ionization chamber as the reference. The\nresults showed that the Dose Probe maintained relative errors below 5% in all tests, which closely matched those of the\nionization chamber. This confirmed the ability of the Dose Probe to accurately measure the absorbed dose, including the\nscatter radiation, suggesting its practicality for clinical use. This study validated the use of semiconductor dosimeters in\nclinical settings, supporting a simplified setup, potentially improving the measurement accuracy near detectors and\nenhancing dose management in radiographic practice.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10002_full_name_3":{"attribute_name":"著者（英）","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"JUNSHIN GAKUEN University","affiliationNameLang":"en"}]}],"familyNames":[{"familyName":"TAKAKI","familyNameLang":"en"}],"givenNames":[{"givenName":"Takeshi","givenNameLang":"en"}],"names":[{"name":"Takeshi, TAKAKI","nameLang":"en"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"Hospital of University of Occupational and Environmental Health","affiliationNameLang":"en"}]}],"familyNames":[{"familyName":"KUROKI","familyNameLang":"en"}],"givenNames":[{"givenName":"Ryohei","givenNameLang":"en"}],"names":[{"name":"Ryohei, KUROKI","nameLang":"en"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"Hospital of University of Occupational and Environmental Health","affiliationNameLang":"en"}]}],"familyNames":[{"familyName":"FUJITA","familyNameLang":"en"}],"givenNames":[{"givenName":"Yuki","givenNameLang":"en"}],"names":[{"name":"Yuki, FUJITA","nameLang":"en"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"JUNSHIN GAKUEN University","affiliationNameLang":"en"}]}],"familyNames":[{"familyName":"MURAKAMI","familyNameLang":"en"}],"givenNames":[{"givenName":"Seiichi","givenNameLang":"en"}],"names":[{"name":"Seiichi, MURAKAMI","nameLang":"en"}]}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"純真学園大学","subitem_publisher_language":"ja"},{"subitem_publisher":"JUSHIN GAKUEN UNIVERSITY","subitem_publisher_language":"en"}]},"item_10002_source_id_9":{"attribute_name":"item_10002_source_id_9","attribute_value_mlt":[{"subitem_source_identifier":"2186-6481","subitem_source_identifier_type":"ISSN"}]},"item_1710308327429":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"【報告】Evaluation of Semiconductor Dosimeter for Measuring Air Kerma Including Scattered Radiation","subitem_title_language":"en"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2025-06-10"}],"displaytype":"detail","filename":"【報告】Evaluation of Semiconductor Dosimeter for Measuring Air Kerma.pdf","filesize":[{"value":"489 KB"}],"format":"application/pdf","licensetype":"license_5","url":{"url":"https://junshin.repo.nii.ac.jp/record/2000097/files/【報告】Evaluation of Semiconductor Dosimeter for Measuring Air Kerma.pdf"},"version_id":"e1328910-5530-4a21-ac77-064cc2446a55"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Semiconductor Dosimeter","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Dose optimization","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Air kerma","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Scattered radiation","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"digital radiography","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"item_resource_type","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"【報告】Evaluation of Semiconductor Dosimeter for Measuring Air Kerma Including Scattered Radiation","item_type_id":"10002","owner":"12","path":["1746836280329"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2025-06-10"},"publish_date":"2025-06-10","publish_status":"0","recid":"2000097","relation_version_is_last":true,"title":["【報告】Evaluation of Semiconductor Dosimeter for Measuring Air Kerma Including Scattered Radiation"],"weko_creator_id":"12","weko_shared_id":-1},"updated":"2025-06-09T06:19:26.305984+00:00"}